Groeseneken, Guido
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Proceedings Of The 7th European Symposium Symposium On Reliability Of Electron Devices, Failure Physics And Analysis
ESD Protection Challenges: FinFET Technology and RF CMOS Circuits
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, 47)
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, 47)
Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs
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